Author: S.C. Gutierrez, R.C. Haught, D.A. Lytle, E.W. Rice and M.M. Williams A. Omelchenko, W. Lockhart and P. Wilkinson1 N.F. Starodub, A.M. Katzev, V.M. Sta
ISBN: 978-1-4020-3114-4 (Print) 978-1-4020-3116-8 (Online)
Press: Springer Netherlands
Formats: PDF